Our Soft Error Tools
- TFIT cell level — Soft error simulation tool at transistor level for library designers more
- SOCFIT circuit level — Soft error simulation tool at circuit level for chip architect more
The Standard for Soft Error Prevention
Electronic devices are constantly exposed to natural radiations. This can lead to single event effect (SEE) at any time.
SEE cause unpredictable system behavior and threaten safety and reliability. This threat is increasing with small geometries.
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