We are pleased to let you know that our paper titled “Neutron and Alpha Soft Error Rate Simulations for Memory and Logic Devices at Advanced Technologies” has been selected for an oral presentation at SELSE 2013. iROC Technologies will present the paper at SELSE 2013.
We will speak at two session on March 26th so please make sure to meet us there.
Day 1 – March 26th, 2013 – Stanford University
11:00 – 12:00 Session III: SER of Memory Cells
Neutron and Alpha Soft Error Rate Simulations for Memory and Logic Devices at Advanced Technologies
Yi-Pin Fang (TSMC), Anthony S. Oates (TSMC), Kader Belhaddad (IROC), Vincent Correas (IROC), Issam Nofal (IROC) and Olivier Lauzeral (IROC)
13:00 – 14:15 Session IV: Poster session
Towards a Hierarchical and Scalable Approach for Modeling the Effects of SETs
Enrico Costenaro (IROC), Adrian Evans (IROC), Dan Alexandrescu (IROC), Liang Chen (KIT), Mehdi Tahoori (KIT) and Michael Nicolaidis (TIMA)
Day 2 – March 27th, 2013 – Stanford University
11:15 – 12:15 Session IX: Panel Discussion
Topic: Reliability Roadmaps: Are the Predictions Getting Better or Worse?
Moderator: Adrian Evans (IROC)
Yi-Pin Fang (TSMC)
Austin Lesea (Xilinx)
Subhasish Mitra (Stanford)
Shi-Jie Wen (Cisco Systems)
Alan Wood (Oracle)