Your Functional Reliability Partner – IROC Technologies
+33 438 120 763 (FR)
+1 408 982 9993 (US)
Contact Us
Support Site

Archive for the Papers Category

IEEE International Reliability Innovation Conference – March 17, 2016, San Jose, CA

IROC sponsors and contributes to IEEE IRIC. Radiation Effects in Solid State Drives Enrico Costenaro, Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Olivier Lauzeral Abstract Solid state drives (SSD) are used to store highly critical data in cloud and HPC applications. Silent data corruption (SDC) is a serious concern […]

Read more