IROC will participating in the SEE Symposium MAPLD on May 23rd in La Jolla, California.
During a keynote talk by Adrian Evans, we will present the results of a detailed
study of Single Event Transients (SETs) in a 65nm space technology, including novel
new techniques for measuring SET pulse widths.
- Automotive
- Aerospace
- Medical
- Networking
- Computing
- IROC
- Solutions
- Functional Safety Verification & Management
- Design-level Fault Simulation Tools and Services
- Design- and System-level Reliability Management Solutions
- Soft Error Rate (SER) Testing Solutions
- SSD SER Testing
- Transistor/Cell-level Fault Simulation Tools and Services
- Technology-, Design- and System-level Hardening Against Single Events
- IPs for Fault-Free, High-Performance Operation
- Cross-layer Reliability Analysis and Exchanges
- Library