IROC Technologies is thrilled to share that Semiwiki has published an in-depth article about our innovative Transistor Failure In Time – TFIT®- solution, demonstrating how unique soft error analysis contributes to a safer applications.

The article, titled “How IROC Makes the World a Safer Place with Unique Soft Error Analysis” by Mike Gianfagna, details the critical role IROC Technologies plays in mitigating the effects of soft errors in semiconductor devices. As the world increasingly relies on advanced processes and reliability-critical applications, addressing these deficiencies has become paramount.

IROC prouds to have our CEO, Issam Nofal, explains in the article, explaining how TFIT® works, its unique capabilities, and its significant impact on ensuring functional safety in applications ranging from autonomous vehicles to medical devices.

A huge thanks to Mike and Semiwiki for highlighting our work.

Read the full article here and learn how TFIT® is making a difference: https://semiwiki.com/eda/iroc-technologies/346072-how-iroc-makes-the-world-a-safer-place-with-unique-soft-error-analysis/

Also, don’t miss the chance to meet us in person! IROC will be participating at DAC at the end of June. Visit us at booth #2557 to learn more about our solutions and how we can help you achieve your target FIT rate.