IROC will be participating in the System-to-Silicon Performance Modeling and Analysis – Power, Temperature and Reliability workshop at DAC, in Austin on Sunday June 5th. Come hear our talk on “Modeling of Variability and Aging Effects Across Abstraction Layers” including the latest updates from the MoRV FP7 Research Project.
- Automotive
- Aerospace
- Medical
- Networking
- Computing
- IROC
- Solutions
- Functional Safety Verification & Management
- Design-level Fault Simulation Tools and Services
- Design- and System-level Reliability Management Solutions
- Soft Error Rate (SER) Testing Solutions
- SSD SER Testing
- Transistor/Cell-level Fault Simulation Tools and Services
- Technology-, Design- and System-level Hardening Against Single Events
- IPs for Fault-Free, High-Performance Operation
- Cross-layer Reliability Analysis and Exchanges
- Library